High performance Atomic Force Microscopes (AFMs) are designed to uncover surface properties ranging from shape and texture to local stiffness and conductivity in various application fields including semiconductors, data storage and polymers, to name a few.
Oxford Instruments Asylum Research will present an overview of their new Jupiter XR AFM. This is an excellent opportunity for students, researchers and team leaders to learn about how AFM could impact their projects or just to get a glimpse of the advances of AFM technology.