Electron Microscopy

Spring Microscopy Workshop - Materials Imaging and Characterization Facility (Imaging Cores - Kuiper)

The Materials Imaging and Characterization Facility (Imaging Cores - Kuiper) invites you to attend the Spring Microscopy Workshop, offered on Friday May 17, 2019 from 9am to 5pm. The workshop is open to all interested undergraduate and graduate students and staff. A pizza lunch will be provided.

Topics:

  • Scanning Electron Microscopy (SEM)
  • Focused Ion Beam Sample Preparation (FIB)
  • Transmission Electron Microscopy (TEM)

Including Hands-on sessions at the instruments!

Juliane Weber

Juliane Weber has a bachelor and master degree from the University of Bonn, Germany and PhD degree from the RWTH University of Aachen, Germany. During her PhD she worked at the Forschungszentrum Juelich GmbH in close collaboration with the Ernst-Ruska Centre for Microscopy and Spectroscopy with Electrons (ER-C). She did her postdoc at the Oak Ridge National Laboratory working in close collaboration with the Center for Nanophase Material Sciences (CNMS). She has experience in working with SEM, TEM, atom probe tomography, atomic force microscopy and neutron scattering.

Daniel Alberts

Daniel is a Masters student in the Department of Geosciences.

“Lab in the gap” - the UA’s new Electron Microscope is ready for solving big scientific problems

An electron microscope uses electrons to probe an object, measuring the physical, chemical and microstructural information down to atomic-level resolution. Recently, there are transformative advancements in electron microscopy: 1) stable, easy-to-use automated aberration correction enables 80pm-resolution instrument for solving real-world problems; and 2) a surge of new development of in situ and environmental techniques.

Jerry Chang

Yao-Jen Chang has a MS degree from Murray State University and PhD degree from University of Kentucky. He is specialized in exploring the structure-property relationships for nanomaterials using electron microscopy techniques, including energy dispersive X-ray spectroscopy (EDX), electron energy loss spectroscopy (EELS), selected area electron diffraction (SAED), in situ liquid cell/heating experiments, and Focused Ion Beam Sample Preparation.

SEM Facility (Geosciences)

Isabel Barton

2016 Imaging Cores Summer Workshop: Scanning Electron Microscopy Imaging and Characterization

 

This Workshop Series supports training on the imaging/characterization tools available in Imaging Cores - Marley (formerly USIF) and Imaging Cores - Kuiper. The workshop will be held Tuesday August 16th - Wednesday August 17th 2016.

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