Submitted by Malliance_admin on Tue, 03/26/2019 - 07:23
Juliane Weber has a bachelor and master degree from the University of Bonn, Germany and PhD degree from the RWTH University of Aachen, Germany. During her PhD she worked at the Forschungszentrum Juelich GmbH in close collaboration with the Ernst-Ruska Centre for Microscopy and Spectroscopy with Electrons (ER-C). She did her postdoc at the Oak Ridge National Laboratory working in close collaboration with the Center for Nanophase Material Sciences (CNMS). She has experience in working with SEM, TEM, atom probe tomography, atomic force microscopy and neutron scattering.
Now accepting registrations for the 49th annual Lehigh Microscopy School which will be held on the campus of Lehigh University, Bethlehem, PA, June 2-7, 2019. All courses, lecturers and instrumentation will be together for what promises to be a phenomenal week!
Course offerings include:
Submitted by Daniel_Alberts on Mon, 08/20/2018 - 09:53
Daniel is a Masters student in the Department of Geosciences.
This workshop will discuss, through seminars and practical sessions, the technological advances that make nanometer and sub-nanometer elemental characterization possible at wide range of energies in the TEM and SEM.
Afternoon practical sessions featuring hands on demonstrations will use the Imaging Cores - Kuiper (Materials Imaging and Characterization Facility):
An electron microscope uses electrons to probe an object, measuring the physical, chemical and microstructural information down to atomic-level resolution. Recently, there are transformative advancements in electron microscopy: 1) stable, easy-to-use automated aberration correction enables 80pm-resolution instrument for solving real-world problems; and 2) a surge of new development of in situ and environmental techniques.
Submitted by Jerry_Chang on Mon, 02/27/2017 - 12:59
Yao-Jen Chang has a MS degree from Murray State University and PhD degree from University of Kentucky. He is specialized in exploring the structure-property relationships for nanomaterials using electron microscopy techniques, including energy dispersive X-ray spectroscopy (EDX), electron energy loss spectroscopy (EELS), selected area electron diffraction (SAED), in situ liquid cell/heating experiments, and Focused Ion Beam Sample Preparation.
Submitted by Isabel_Barton on Tue, 09/13/2016 - 11:17
Submitted by Isabel_Barton on Tue, 09/13/2016 - 10:54
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