Focused Ion Beam (FIB)

Spring Microscopy Workshop - Materials Imaging and Characterization Facility (Imaging Cores - Kuiper)

The Materials Imaging and Characterization Facility (Imaging Cores - Kuiper) invites you to attend the Spring Microscopy Workshop, offered on Friday May 17, 2019 from 9am to 5pm. The workshop is open to all interested undergraduate and graduate students and staff. A pizza lunch will be provided.

Topics:

  • Scanning Electron Microscopy (SEM)
  • Focused Ion Beam Sample Preparation (FIB)
  • Transmission Electron Microscopy (TEM)

Including Hands-on sessions at the instruments!

Lehigh University Microscopy School 2019

Now accepting registrations for the 49th annual Lehigh Microscopy School which will be held on the campus of Lehigh University, Bethlehem, PA, June 2-7, 2019. All courses, lecturers and instrumentation will be together for what promises to be a phenomenal week!

Course offerings include:

FEI Helios DualBeam SEM/FIB