Scanning electron microscopy (SEM)

Spring Microscopy Workshop - Materials Imaging and Characterization Facility (Imaging Cores - Kuiper)

The Materials Imaging and Characterization Facility (Imaging Cores - Kuiper) invites you to attend the Spring Microscopy Workshop, offered on Friday May 17, 2019 from 9am to 5pm. The workshop is open to all interested undergraduate and graduate students and staff. A pizza lunch will be provided.


  • Scanning Electron Microscopy (SEM)
  • Focused Ion Beam Sample Preparation (FIB)
  • Transmission Electron Microscopy (TEM)

Including Hands-on sessions at the instruments!

Juliane Weber

Juliane Weber has a bachelor and master degree from the University of Bonn, Germany and PhD degree from the RWTH University of Aachen, Germany. During her PhD she worked at the Forschungszentrum Juelich GmbH in close collaboration with the Ernst-Ruska Centre for Microscopy and Spectroscopy with Electrons (ER-C). She did her postdoc at the Oak Ridge National Laboratory working in close collaboration with the Center for Nanophase Material Sciences (CNMS). She has experience in working with SEM, TEM, atom probe tomography, atomic force microscopy and neutron scattering.

Lehigh University Microscopy School 2019

Now accepting registrations for the 49th annual Lehigh Microscopy School which will be held on the campus of Lehigh University, Bethlehem, PA, June 2-7, 2019. All courses, lecturers and instrumentation will be together for what promises to be a phenomenal week!

Course offerings include:

Daniel Alberts

Daniel is a Masters student in the Department of Geosciences.

High Resolution Elemental Analysis from 2kV to 200kV Workshop

This workshop will discuss, through seminars and practical sessions, the technological advances that make nanometer and sub-nanometer elemental characterization possible at wide range of energies in the TEM and SEM.

Afternoon practical sessions featuring hands on demonstrations will use the Imaging Cores - Kuiper (Materials Imaging and Characterization Facility):