Bruker Multimode 8 Atomic Force Microscope (Chem & Biochem)

Multimode 8 AFM
Can non-UA users access this equipment?: 
Who can use this equipment?: 
Trained users (inquire with the facility regarding training)
Chemical Sciences [44]
Room #: 
Technical expert(s): 

The Multimode 8 from Bruker Nano is designed for high resolution imaging of material surfaces. A J-pieozoelectric scanner capable of measuring areas up to 120 µm x 120 µm with a vertical range of ~ 5 µm is available for use. Sample size is limited to ~ 1 cm x 1 cm mounted on 10 mm or 12 mm magnetic steel platens. This instrument is on a vibration isolation table.  Quantitative probe calibration is available on this instrument.

Imaging Modes: PeakForce Tapping Mode, PeakForce Tapping Mode with ScanAsyst, Force Spectroscopy, Tapping Mode, Contact Mode, Phase Imaging, Quantitative Nanomechanical Measurements, Scanning Kelvin Probe, Conductive Probe (CAFM or TUNA), Force Modulation, Scanning Tunneling Microscopy, and Imaging in Liquids

Fees as of February 1st, 2015:  Internal $15/hour; Internal Assisted $45/hour; External Assisted $102/hour

*AFM probes are billed separately at cost.

PUBLICATION ACKNOWLEDGEMENT: All Multimode AFM images and data were collected in the W.M. Keck Center for Nano-Scale Imaging in the Department of Chemistry and Biochemistry at the University of Arizona.  This instrument purchase was supported by Arizona Technology and Research Initiative Fund (A.R.S.§15-1648).


Electron/beam/force microscope - categorization: