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Friday, February 6, 2015 - 07:45 to Tuesday, April 14, 2015 - 07:45

Now accepting registrations for the 45th annual Lehigh Microscopy School which will be held June 7-12, 2015.  All courses, lecturers, and instrument suppliers will be together for what promises to be a phenomenal week.

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Friday, February 6, 2015 - 07:45 to Tuesday, March 31, 2015 - 20:00

We are happy to announce the second edition of the CIF Summer School, which this year will feature a 3-day workshop on electron diffraction methods for materials analysis (May 19-21, 2015). Registration will open mid-January to both CSU and non-CSU students and researchers.

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Tuesday, February 3, 2015 - 08:00 to Friday, February 13, 2015 - 17:00

High performance confocal Raman microscopy and imaging

An opportunity to explore the analytical power of Raman spectroscopy, using the Renishaw inVia confocal Raman microscope; the industry leading standard, offering very high sensitivity and throughput performance.

The confocal Raman microscope system will be available to run samples on a pre-booked basis. Please contact Andrew King, Renishaw Inc to book some time on the system.

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Wednesday, January 14, 2015 - 10:00 to 11:30

Dr. Les Loew from UConn, will be joining us for our joint seminar on January 14th, 2015 to kick off the new year! Dr. Loew is a Professor of Cell Biology & Computer Science & Engineering at UConn. He is the Director of the Center for Cell Analysis & Modeling and Editor-in-chief of Biophysical Journal. Dr. Loew studies how the spatial organization of molecules in cells are used to control cell function.

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Monday, December 22, 2014 - 11:00 to Wednesday, January 14, 2015 - 09:00

CMM 565a Fundamentals of Light Microscopy and Electronic Imaging (2015 - spring semester)

This class will teach students the fundamentals as well as advanced levels of the many modes of light microscopy (e.g. fluorescence, confocal and live cell imaging) required for today’s investigators in medical and other biological sciences.

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Monday, December 22, 2014 - 11:00 to Wednesday, January 14, 2015 - 11:00

Course Description: Theoretical and practical aspects of electron-beam microanalysis. Lab emphasizes projects and independent research using scanning electron microscopy and energy dispersive X-ray analysis.
Purpose: This course is designed to provide students with the necessary background for SEM/EDS microanalysis on a wide variety of materials.

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