Electron Microscopy

UA-Hitachi scholarship in Electron Microscopy

The Kuiper Materials Imaging and Characterization Facility is pleased to announce the annual Hitachi Scholarship in Electron Microscopy. This scholarship is established by Hitachi High-Technologies as part of their partnership with University of Arizona. Funds in the amount of $5,000 per year have been provided and will be awarded equally to two graduate students generating cutting-edge research and publications in the area of electron microscopy.

Zachary Michels

I am a research scientist in the Geoscience department and the SEM Lab Manager at the Arizona LaserChron Center.

My PhD research and continued research and teaching focuses on microtectonics and the coevolution of rock microstructure and lithospheric rheology.

Paula Tonino

Zoe Zeszut

Zoe Zeszut has an MS in Earth and Planetary Sciences from Case Western Reserve University, with research focusing on mineralogy and physical properties of carbonaceous meteorites through use of Auger Electron Spectroscopy and Focused Ion Beam sputtering. Zoe previously worked with the OSIRIS-REx asteroid sample return mission as an operations engineer and will continue to support the mission for sample analysis at KMICF. 

Spring Microscopy Workshop - Materials Imaging and Characterization Facility (Imaging Cores - Kuiper)

The Materials Imaging and Characterization Facility (Imaging Cores - Kuiper) invites you to attend the Spring Microscopy Workshop, offered on Friday May 17, 2019 from 9am to 5pm. The workshop is open to all interested undergraduate and graduate students and staff. A pizza lunch will be provided.

Topics:

  • Scanning Electron Microscopy (SEM)
  • Focused Ion Beam Sample Preparation (FIB)
  • Transmission Electron Microscopy (TEM)

Including Hands-on sessions at the instruments!

“Lab in the gap” - the UA’s new Electron Microscope is ready for solving big scientific problems

An electron microscope uses electrons to probe an object, measuring the physical, chemical and microstructural information down to atomic-level resolution. Recently, there are transformative advancements in electron microscopy: 1) stable, easy-to-use automated aberration correction enables 80pm-resolution instrument for solving real-world problems; and 2) a surge of new development of in situ and environmental techniques.

Jerry Chang

Yao-Jen Chang has a MS degree from Murray State University and PhD degree from University of Kentucky. He is specialized in exploring the structure-property relationships for nanomaterials using electron microscopy techniques, including energy dispersive X-ray spectroscopy (EDX), electron energy loss spectroscopy (EELS), selected area electron diffraction (SAED), in situ liquid cell/heating experiments, and Focused Ion Beam Sample Preparation.

SEM Facility (Geosciences)

Isabel Barton

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