FEI Inspec-S Scanning Electron Microscope (Chem & Biochem)

FEI Inspec-S Scanning Electron Microscope
Can non-UA users access this equipment?: 
Yes
Who can use this equipment?: 
Trained users (inquire with the facility regarding training)
Building: 
Chemical Sciences [44]
Room #: 
135
Technical expert(s): 
Capabilities: 

The FEI Inspect S SEM is equipped with a tungsten filament, secondary electron detector for standard imaging, a back scattered electron detector, Thermo Noran System Six X-ray microanalysis system (EDS), and a J.C. Nabity Nanometer Pattern Generation Sytem (NPGS) for electron beam patterning and lithography. The SEM will be capable of patterning 80 nm or less line widths. The EDS system provides chemical elemental composition of samples. Additionally the SEM can be operated in environmental mode with variable pressures ranging from 0.6 Torr to 0.08 Torr.  Image digital resolution up to 4096 x 3536.

Imaging Modes: Secondary Electron Imaging, Back Scattered Electron Imaging, Low Vacuum Imaging, Energy-Dispersive X-ray Spectroscopy (EDS), and J.C. Nabity E-beam Lithography.

Fees as of February 1st, 2015:  Internal $30/hour; Internal Assisted $60/hour; External Assisted $174/hour

Location: