Hitachi S-3400N variable pressure SEM with Energy Dispersive X-ray microanalysis

Hitachi S-3400N variable pressure SEM with Energy Dispersive X-ray microanalysis (USIF)
Can non-UA users access this equipment?: 
Yes
Who can use this equipment?: 
Trained users (inquire with the facility regarding training)
Building: 
Kuiper Space Sciences [92]
Room #: 
11
Technical expert(s): 
Capabilities: 

Hitachi S-3400N Type II / ThermoNORAN NSS EDS: Variable Pressure SEM - Tungsten thermionic emitter, Quad Bias; Resolution 30nm at 3KV, 3nm at 30KV; SE and BSE; Samples as tall as 30mm; Chamber pressure 6 to 270 Pa in variable pressure mode; EDS detection range Boron and higher; EDS Quant, line, map, imaging.

Location: