Hitachi S-4800 Field Emission SEM with Energy Dispersive X-ray microanalysis

Hitachi S-4800 Field Emission SEM with Energy Dispersive X-ray microanalysis (USIF)
Can non-UA users access this equipment?: 
Yes
Who can use this equipment?: 
Trained users (inquire with the facility regarding training)
Building: 
Kuiper Space Sciences [92]
Room #: 
11
Technical expert(s): 
Capabilities: 

Hitachi S-4800 Type II / ThermoNORAN NSS EDS: Field-Emission SEM - Cold field emission electron gun; Resolution 1nm at 15 KV, 1.4nm at 1KV; Magnification 20X to 800,000X; Imaging voltages 100V to 30KV; STEM detector; BSE low and/or high angle; EDS detection range Boron and higher; EDS Quant, line, map, imaging.

Location: