JEOL 6010LA benchtop SEM (Geosciences)

Can non-UA users access this equipment?: 
Who can use this equipment?: 
Trained users (inquire with the facility regarding training)
Gould-Simpson [77]
Room #: 
Technical expert(s): 

JEOL 6010LA benchtop scanning electron microscope with with secondary electron, back-scattered electron, and energy dispersive microanalysis detectors. Extra-large sample chamber can accommodate and examine raw or polished samples up to 50 mm in height. The chamber pressure can be manipulated to allow for examination of uncoated samples in low-vacuum mode. 

Rates are $30/hr for a user, unsupervised (users must be trained and authorized first) or $75/hr for SEM use with an operator included.