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Park NX20 AFM

Park NX20 AFM

Park Systems NX20 Atomic Force Microscope (AFM) designed for imaging in non-contact mode AFM with automated imaging optimization, this instrument is useful imaging very soft surfaces or samples with high aspect ratio features. Additionally, the NX20 can accept samples up to 8 inches in diameter while imaging areas up to 100 um2. The instrument is in an isolation box with an active vibration isolation system.

Imaging Modes: Non-Contact Mode, Tapping Mode, and Contact Mode

PUBLICATION ACKNOWLEDGEMENT: All Park AFM images and data were collected in the W.M. Keck Center for Nano-Scale Imaging(RRID:SCR_022884) in the Department of Chemistry and Biochemistry at the University of Arizona. This instrument purchase was partially supported by Arizona Technology and Research Initiative Fund (A.R.S.§15-1648).