![Park NX20 AFM](/sites/default/files/styles/az_small/public/2023-03/Park%201%20crop.png?itok=4UZ9wlNf)
Park NX20 AFM
Park Systems NX20 Atomic Force Microscope (AFM) designed for imaging in non-contact mode AFM with automated imaging optimization, this instrument is useful imaging very soft surfaces or samples with high aspect ratio features. Additionally, the NX20 can accept samples up to 8 inches in diameter while imaging areas up to 100 um2. The instrument is in an isolation box with an active vibration isolation system.
Imaging Modes: Non-Contact Mode, Tapping Mode, and Contact Mode
PUBLICATION ACKNOWLEDGEMENT: All Park AFM images and data were collected in the W.M. Keck Center for Nano-Scale Imaging(RRID:SCR_022884) in the Department of Chemistry and Biochemistry at the University of Arizona. This instrument purchase was partially supported by Arizona Technology and Research Initiative Fund (A.R.S.§15-1648).