Focused Ion Beam (FIB) milled cross section in copper on the FEI Helios 660 G3 FIB-SEM DualBeam microscope. A protective cap of ion deposited platinum is necessary as polycrystalline copper mills at different rates which otherwise results in spires and curtains in the final cross section. (Dr. Paul Wallace)
Scanning Electron Microscope (SEM) image of the head of a fly (Hitachi S3400) - Kuiper Imaging, Juliane Weber, PhD
Atomic Force Microscope (AFM) image of Perylene deposited on highly ordered pyrolytic graphite. (2 micron image) Derek Mangelsdorf (Armstrong Group) and Brooke Beam
Drosophila neuropil - Transmission Electron Microscope (TEM) - Patty Jansma
Aspergillus spore structure, lactophenol blue staining with Differential Interference Contrast (DIC) - Pummi Singh
Scanning electron microscopy (SEM) image of a circuit board. Dee Belle-Oudry
Scanning electron microscopy (SEM) image of the broken edge of mechanical pencil lead. Brooke Massani
Liver - Oil Red O stain for lipids (cryostat section) - Cromey
Widefield and deconvolved image of fluorescently labeled fibroblasts - Patty Jansma
Geosciences Scanning Electron Microscope (Isabel Fay Barton)
Scanning electron microscopy (SEM) image of Strontianite (SrCO3) crystals grown on a calcite surface. (FEI Helios 660) - Kuiper Imaging, Juliane Weber, PhD