High resolution analytical, 200 keV transmission electron microscope (TEM)
- X-Ray spectroscopy for elemental analysis and electronic/chemical analysis
- Equipped with a high brightness source that provides a low (0.3 eV) energy spread for electron energy-loss spectroscopy (EELS); a probe aberration corrector for high-resolution (78 pm) scanning TEM (STEM) imaging; an Oxford Instruments large solid angle (2.0 sr) energy-dispersive X-ray spectrometer system for chemical mapping; and a Gatan GIF Quantum ER EELS spectrometer (with dual EELS capability) for atomic scale chemical spectroscopy and imaging.
- Imaging detectors including: bright-field STEM, annular (both medium and high angle) dark-field, and secondary electron
- Gatan OneView 4K x 4K CMOS camera for TEM image acquisition.