Microscopes
| Equipment | Capabilities | Building |
|---|---|---|
| FEI Helios DualBeam SEM/FIB | Scanning Electron Microscope (SEM), Focused Ion Beam (FIB-SEM), Electron Backscatter Diffraction (EBSD), Energy Dispersive Spectroscopy (EDS) | Kuiper Space Sciences |
| Hitachi HF5000 - 200KeV aberration corrected TEM | Scanning TEM (STEM), Transmission electron microscopy (TEM), Energy Dispersive Spectroscopy (EDS), Electron Energy Loss Spectroscopy (EELS), Dark-field, Secondary Electron Detector | Kuiper Space Sciences |
| Hitachi S-3400N variable pressure SEM with Energy Dispersive X-ray microanalysis | Raman spectroscopy, Scanning Electron Microscope (SEM), Characterization/analysis, Energy Dispersive Spectroscopy (EDS), Secondary Electron Detector | Kuiper Space Sciences |
| Hitachi S-4800 Field Emission SEM with Energy Dispersive X-ray microanalysis | Scanning TEM (STEM), Scanning Electron Microscope (SEM), Energy Dispersive Spectroscopy (EDS), Secondary Electron Detector | Kuiper Space Sciences |
| Renishaw Reflex Raman (Optical) | Raman spectroscopy, Upright optical microscope | Kuiper Space Sciences |