Hitachi S-3400N variable pressure SEM with Energy Dispersive X-ray microanalysis

Kuiper-Arizona Laboratory for Astromaterials Analysis

Hitachi S-3400N Type II / ThermoNORAN NSS EDS: Variable Pressure SEM - Tungsten thermionic emitter, Quad Bias; Resolution 30nm at 3KV, 3nm at 30KV; SE and BSE; Samples as tall as 30mm; Chamber pressure 6 to 270 Pa in variable pressure mode; EDS detection range Boron and higher; EDS Quant, line, map, imaging.

Capabilities:

Raman spectroscopy

Scanning Electron Microscope (SEM)

Characterization/analysis

Energy Dispersive Spectroscopy (EDS)

Secondary Electron Detector